Research on Memory Leak Detection and Dynamic Debugging Methods for Embedded Systems

WANG Jian, WEN Chen

Technology of IoT&AI ›› 2026, Vol. 58 ›› Issue (1) : 130-134.

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Technology of IoT&AI ›› 2026, Vol. 58 ›› Issue (1) : 130-134.

Research on Memory Leak Detection and Dynamic Debugging Methods for Embedded Systems

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 58(1): 130-134

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