New Fast Defect Detection Method Based on Numerical Logic Operation

YAN Han

Technology of IoT&AI ›› 2026, Vol. 58 ›› Issue (9) : 52-55.

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PDF(1432 KB)
Technology of IoT&AI ›› 2026, Vol. 58 ›› Issue (9) : 52-55.

New Fast Defect Detection Method Based on Numerical Logic Operation

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 58(9): 52-55

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